
Shawn Blanton
Shawn Blanton is a distinguished Trustee Professor of Electrical and Computer Engineering at Carnegie Mellon University. He holds the position of Associate Director at the SYSU-CMU Joint Institute of Engineering, where he plays a pivotal role in fostering international collaboration and innovation. Blanton earned his Ph.D. in Electrical Engineering and Computer Science from the University of Michigan, Ann Arbor, a testament to his profound expertise in the field. His research interests are deeply rooted in integrated system tests, testable design, and the development of test methodologies. Blanton's work has significantly contributed to advancing the reliability and efficiency of electronic systems. As a Fellow of the IEEE and a Senior Member of the ACM, he is recognized for his substantial contributions to the field of electrical and computer engineering. In addition to his academic achievements, Blanton has a wealth of experience in consulting for various companies, providing insights and solutions that bridge the gap between theoretical research and practical application. His entrepreneurial spirit led him to found TestWorks, a spinout from Carnegie Mellon University. TestWorks focuses on extracting valuable information from integrated circuit (IC) test data, enhancing the quality and performance of semiconductor devices. Blanton's recent presentation at the University of Maryland-Baltimore County (UMBC) highlighted his commitment to addressing contemporary challenges in the semiconductor industry. He discussed the design of secure hardware systems, emphasizing the importance of logic locking and the complexities associated with overseas fabrication. His insights are invaluable in navigating the evolving landscape of global semiconductor manufacturing. Through his teaching, research, and industry engagement, Shawn Blanton continues to inspire the next generation of engineers and contribute to the advancement of technology. His work not only enhances the academic community but also has a lasting impact on the broader field of electrical and computer engineering.
Publications
, 12-19, 2019-02-01
, 1559-1572, 2014-10-01